Portable Multifunction Electronic Component Tester
The FNLCRP1 is a portable LCR tester designed for the fast, accurate measurement of resistance, capacitance and inductance. Ideal for lab work, repair and prototyping, it also allows testing of common electronic components with automatic recognition.
SKU 6080-FNLCRP1Brand: FNIRSIProduct type: Component & LED testersSpecial test instruments
Description
The FNLCRP1 is a portable digital LCR tester designed for measuring and analysing the main passive and discrete electronic components. Thanks to its compact format and ease of use, it is a practical tool for lab work, electronic maintenance and prototype development.
The device allows fast measurements of resistance, capacitance and inductance, and also integrates advanced functions such as ESR measurement and automatic component recognition. This combination makes it particularly useful for technicians, repairers and makers who need a versatile, straightforward instrument.
Automatic component testing with pin identification
Automatic recognition of active and passive components with pin identification and display of the main parameters. It supports transistors (NPN, PNP, MOSFET, JFET), diodes and LCR components, simplifying test operations and reducing diagnostic time. It also integrates an infrared decoding function for analysing remote signals.
Fast, intelligent component recognition
Fast automatic component identification with immediate display of pins and main parameters. It allows transistors, diodes and passive components to be analysed without manual configuration, reducing errors and test times during lab work and repair.
Built-in infrared decoding for remote controls
Built-in infrared decoding function for analysing remote control signals. It allows IR codes to be captured and interpreted, useful for testing, developing and repairing electronic devices based on remote control. An additional feature that extends the operating possibilities beyond simple component testing.
Modular system with interchangeable board
Structure with a removable test socket and interchangeable boards that allow quick configuration for different types of components. The system makes insertion, replacement and measurement easy without complex wiring, improving operating speed and reliability in lab testing and electronic repair.
Comprehensive electronic component testing
Extended support for measuring active and passive components, including capacitors, inductors, MOSFETs and transistors. The system automatically recognises the connected device and displays its main parameters, allowing fast, reliable checks without manual settings. Ideal for diagnostics, component selection and lab work.
Zener diode measurement with dedicated channel
Independent measurement channel for characterising Zener diodes, with dedicated internal power supply. It allows accurate breakdown voltage testing up to 32 V without external instrumentation, ensuring stable, repeatable results in component verification and selection work.
A versatile tool for the lab, repair work and teaching
Designed to adapt to different operating contexts, from electronic prototyping to equipment maintenance, right through to use in teaching and research. The combination of automatic tests and fast measurements makes it a practical tool for technicians, makers, labs and training centres.
| Technical Specifications |
| Power supply | Built-in lithium battery |
| Battery capacity | 300 mAh |
| Charging | USB-C, 5 V / 1 A |
| Operating temperature | 0 °C ~ 40 °C |
| Protection | Anti-burn protection |
| Firmware update | Supported |
| Package contents |
- Component tester main unit
- USB-C charging cable
- Set of test probes (red, black, green)
- SMD component test board
- User manual
| Documentation and Downloads |
Technical details
| Product type | Multifunction electronic component tester |
|---|---|
| Model | LCR-P1 |
| Dimensions | 71 × 87 × 28 mm |
| Display | 1.44" colour screen |
| Display type | Digital |
| Resistance range | 0.01 Ω – 50 MΩ |
| Capacitance range | 25 pF – 100 mF |
| Inductance range | 10 µH – 1000 µH |
| Transistor test | hFE 10 – 600 |
| Supported transistor types | NPN, PNP, MOSFET, JFET, IGBT |
| Diode test | Forward voltage < 4.5 V |
| Zener diode test | 0.01 – 32 V |
| Thyristor test | Trigger voltage < 5 V, gate current < 6 mA |
| IR decoding | NEC protocol support |
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